TY - GEN
T1 - Classification of experimental errors done in VISIR with simple alternated current circuits
AU - Mendonca, Lucas Nascimento
AU - MacAneiro, Mayara
AU - Alves, Gustavo R.
AU - Pires, Danubia Soares
AU - Garcia-Zumbia, Javier
AU - Cuadros, Jordi
AU - Serrano, Vanessa
N1 - Funding Information:
The authors would like to acknowledge the support of the VISIR Community as well as the financial support provided by the Foundation for Science and Technology (FCT, Portugal) through grant UID/EQU/00305/2013 - Center for Innovation in Engineering and Industrial Technology – CIETI.
Funding Information:
This work was supported by the Federal Institute of Maranhão (IFMA), Federal Institute of Santa Catarina (IFSC) and the Institute of Engineering of the Polytechnic of Porto (ISEP/IPP).
Publisher Copyright:
© 2020 IEEE.
PY - 2020/4
Y1 - 2020/4
N2 - During experiments with electric circuits, students often make mistakes. To handle these situations, remote laboratories such as VISIR (Virtual Instruments Systems in Reality) rely on error-handling mechanisms, which do not always cover all errors. This article seeks to extend a previously published work when trying to assimilate all possible errors in alternated current circuits with a single power supply and a single passive component. The goal is to build an errors' map with all possible errors, covering all circuits that can be assembled in VISIR, from the simplest to the most complex. This allows limiting misconceptions during theoretical and practical understanding are limited.
AB - During experiments with electric circuits, students often make mistakes. To handle these situations, remote laboratories such as VISIR (Virtual Instruments Systems in Reality) rely on error-handling mechanisms, which do not always cover all errors. This article seeks to extend a previously published work when trying to assimilate all possible errors in alternated current circuits with a single power supply and a single passive component. The goal is to build an errors' map with all possible errors, covering all circuits that can be assembled in VISIR, from the simplest to the most complex. This allows limiting misconceptions during theoretical and practical understanding are limited.
KW - Electric circuits
KW - Errors
KW - Experiments
KW - Remote laboratory
KW - VISIR
UR - http://www.scopus.com/inward/record.url?scp=85087868567&partnerID=8YFLogxK
U2 - 10.1109/EDUCON45650.2020.9125340
DO - 10.1109/EDUCON45650.2020.9125340
M3 - Conference contribution
AN - SCOPUS:85087868567
T3 - IEEE Global Engineering Education Conference, EDUCON
SP - 1568
EP - 1572
BT - Proceedings of the 2020 IEEE Global Engineering Education Conference, EDUCON 2020
A2 - Cardoso, Alberto
A2 - Alves, Gustavo R.
A2 - Restivo, Teresa
PB - IEEE Computer Society
T2 - 11th IEEE Global Engineering Education Conference, EDUCON 2020
Y2 - 27 April 2020 through 30 April 2020
ER -