Classification of experimental errors done in VISIR with simple alternated current circuits

Lucas Nascimento Mendonca, Mayara MacAneiro, Gustavo R. Alves, Danubia Soares Pires, Javier Garcia-Zumbia, Jordi Cuadros, Vanessa Serrano

Producción científica: Capítulo del libroContribución a congreso/conferenciarevisión exhaustiva

4 Citas (Scopus)

Resumen

During experiments with electric circuits, students often make mistakes. To handle these situations, remote laboratories such as VISIR (Virtual Instruments Systems in Reality) rely on error-handling mechanisms, which do not always cover all errors. This article seeks to extend a previously published work when trying to assimilate all possible errors in alternated current circuits with a single power supply and a single passive component. The goal is to build an errors' map with all possible errors, covering all circuits that can be assembled in VISIR, from the simplest to the most complex. This allows limiting misconceptions during theoretical and practical understanding are limited.

Idioma originalInglés
Título de la publicación alojadaProceedings of the 2020 IEEE Global Engineering Education Conference, EDUCON 2020
EditoresAlberto Cardoso, Gustavo R. Alves, Teresa Restivo
EditorialIEEE Computer Society
Páginas1568-1572
Número de páginas5
ISBN (versión digital)9781728109305
DOI
EstadoPublicada - abr 2020
Evento11th IEEE Global Engineering Education Conference, EDUCON 2020 - Porto, Portugal
Duración: 27 abr 202030 abr 2020

Serie de la publicación

NombreIEEE Global Engineering Education Conference, EDUCON
Volumen2020-April
ISSN (versión impresa)2165-9559
ISSN (versión digital)2165-9567

Conferencia

Conferencia11th IEEE Global Engineering Education Conference, EDUCON 2020
País/TerritorioPortugal
CiudadPorto
Período27/04/2030/04/20

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