Abstract
A simple and fast method for the treatment of fungal samples for its observation by scanning electron microscopy is described. The procedure is an alternative to the conventional desiccation of the critical point drying technique.
| Translated title of the contribution | Treatment of fungal samples for its observation by scanning electron microscopy |
|---|---|
| Original language | Spanish |
| Pages (from-to) | 7-10 |
| Number of pages | 4 |
| Journal | Afinidad |
| Volume | 62 |
| Issue number | 515 |
| Publication status | Published - Jan 2005 |
Keywords
- Aspergillus
- Fungi
- Mold
- Mucor
- Penicillium
- Scanning electron microscopy (SEM)
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