Structural and morphological differences of thin films obtained by plasma polymerization of pyrrole (Ppy) and thiophene (Pth)

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Abstract

In this work, thin films (thickness ∼ 0.5 μm) were obtained by plasma polymerization of pyrrole (Ppy) and thiophene, (Pth) at 25-30 W and 0.1-0.2 mbar of pressure. Further doping with iodine was carried out to some of the Ppy and Pth films (Ppy/I2, Pth/I2) in order to enhance their electrical conductivity properties. Structural and morphological characterization of both Ppy and Pth as well as of Ppy/I2 and Pth/I2 was performed using Infrared Spectroscopy (IR), X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM). In the light of the information given by IR, XPS and AFM techniques, exhaustive and accurate description of both undoped and I2/doped Ppy and Pth films obtained by Plasma Polymerization is attained.

Original languageEnglish
Pages (from-to)225-230
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume725
Early online dateNov 2002
DOIs
Publication statusPublished - Dec 2002
EventOrganic and Polymeric materials and Devices - Optical, Electrical and Optoelectronic Properties - San Francisco, CA, United States
Duration: 1 Apr 20025 Apr 2002

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