Abstract
A novel method for predicting the radiated emissions of a device from near-field measurements is presented. It is based on the substitution (using a Genetic Algorithm) of the original device by an equivalent set of elemental dipoles, which radiates the same near-field (and therefore, far-field). Since the field produced by a dipole is known, the far-field radiation of the actual radiating source can be calculated. This avoids the use of large semianechoic chambers to measure far-field since it is deducted from the near one. Moreover, this method allows the identification of the radiating sources. Simulations show the viability and usefulness of the new method.
| Original language | English |
|---|---|
| Pages (from-to) | 147-151 |
| Number of pages | 5 |
| Journal | IEEE International Symposium on Electromagnetic Compatibility |
| Volume | 1 |
| Publication status | Published - 2000 |
| Event | 2000 IEEE International Symposium on Electromagneti Compatibility - Washington, DC, USA Duration: 21 Aug 2000 → 25 Aug 2000 |
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