TY - GEN
T1 - Learning from Errors In VISIR DC Circuits
AU - Cuadros, Jordi
AU - Serrano, Vanessa
AU - Garcia-Zubia, Javier
AU - Hernandez-Jayo, Unai
AU - Fernandez-Ruano, Laura
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Virtual Instrument Systems in Reality (VISIR) is a remote laboratory for teaching electronics and electrical circuits. Its log data have been proved useful to assist educational assessment. In parallel, studies of the errors made when using VISIR for simple circuits have been carried out. We now propose a schema to identify these errors from the VISIR traces. This has been used to analyze errors during the teaching of DC circuits. Prevalence of the different types of errors explored. Most errors can be understood as manual errors and these lower with practice. Technical limitations and conceptual errors are more stable and there is no evidence of their reduction with exercise. Furthermore, error patterns seem to be user specific and may help provide additional feedback to those learning how to build and measure DC circuits.
AB - Virtual Instrument Systems in Reality (VISIR) is a remote laboratory for teaching electronics and electrical circuits. Its log data have been proved useful to assist educational assessment. In parallel, studies of the errors made when using VISIR for simple circuits have been carried out. We now propose a schema to identify these errors from the VISIR traces. This has been used to analyze errors during the teaching of DC circuits. Prevalence of the different types of errors explored. Most errors can be understood as manual errors and these lower with practice. Technical limitations and conceptual errors are more stable and there is no evidence of their reduction with exercise. Furthermore, error patterns seem to be user specific and may help provide additional feedback to those learning how to build and measure DC circuits.
KW - automatic assessment
KW - electric and electronic circuits
KW - errors
KW - learning
KW - remote lab
KW - VISIR
UR - http://www.scopus.com/inward/record.url?scp=85196759692&partnerID=8YFLogxK
U2 - 10.1109/exp.at2358782.2023.10546166
DO - 10.1109/exp.at2358782.2023.10546166
M3 - Conference contribution
AN - SCOPUS:85196759692
T3 - 6th Experiment at International Conference, exp.at 2023 - Proceedings
SP - 212
EP - 216
BT - 6th Experiment at International Conference, exp.at 2023 - Proceedings
A2 - Cardoso, Alberto
A2 - Restivo, Maria Teresa
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th Experiment at International Conference, exp.at 2023
Y2 - 5 June 2023 through 7 June 2023
ER -